Zharikova I. The multiprobes connecting devices for electrical testing of electronic devices

The aim is the reliability increasing of multilayer commutative boards (MCB) and BGA electronic components (EC) electrical parameters testing by development of multiprobes connecting device (MCD). An object is a process of electronic devices electric testing by using of contact devices. Methods of researches are a finite element method, computer modeling, method of the Bayesian statistical decisions, methods of mathematical statistics. Results of the investigations - the method of production testing with doubling form of probes that give an opportunity for self-monitoring contact of each probe to test point is developed; the method of connecting MCB and EC to automated measuring equipment by using of MEMS-interface is developed; the method of the Bayesian statistical decisions got further development. Application sphere is testing of electronic devices on instrument-making enterprises. Implementation - on the State Enterprise Kharkiv Kommunar Research and Production Association, educational process of KHNURE, ZNTU and Kremenchug National University.