Bondarenko V. Distributions of elements in near-surface layers of solids under ion irradiation

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0401U003305

Thesis Registration Form

0401U003305.pdf

Applicant for

Specialization

  • 01.04.21 - Радіаційна фізика і ядерна безпека

27-11-2001

Specialized Academic Board

Д 64.845.01

National Science Center "Kharkiv Institute of Physics and Technology"

Essay

The dissertation presents investigation of distributions of elements in near-surface layers of materials under ion irradiation. Implantation profiles of 4He ions in Ni for 0,5-1.8 Mev region were measured. A model of double elastic scattering of fast light ions from foil target was developed. Nuclear microanalysis techniques of measuring of 18O distributions in near-surface layers and measuring of implantation doses of inert gas ions were developed.

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