Kshevetskiy O. Physical methods and devices for determination of real crystal structure by multiple x-ray diffraction

Українська версія

Thesis for the degree of Candidate of Sciences (CSc)

State registration number

0404U004841

Thesis Registration Form

0404U004841.pdf

Applicant for

Specialization

  • 01.04.01 - Фізика приладів, елементів і систем

19-11-2004

Specialized Academic Board

Д 76.244.01

Essay

Thesis is devoted to further developing of methods of two-beam and multiple X-ray diffraction with the purpose of investigation of structural changes in crystals under the action of various external forces. The simulation and comparison between experimental and theoretical diffraction patterns in the Kossel tecnique and curves of diffraction reflectivity were carried out according to the developed techniques with the functional choice of profiles of one-dimensional strains using the optimization its parameters.

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Files

AVTOR-KCHEVEZKIJ.doc

Kshevetskiy.doc

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